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Authors: Aldo Di Carlo, Francesco Santoni
Journal title: 2015 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2015
Published pages: 12.6.1-12.6.4
DOI identifier: 10.1109/IEDM.2015.7409685
ISBN: 978-1-4673-9894-7