Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post Acquisition Data Processing, Visualisation, and Structural Characterisation

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Authors: Gary W. Paterson, Robert W. H. Webster, Andrew Ross, Kirsty A. Paton, Thomas A. Macgregor, Damien McGrouther, Ian MacLaren, Magnus Nord

Journal title: arXiv preprint

Journal publisher: arXiv

Published year: 2020