Fundamental insights into the threshold characteristics of organic field-effect transistors

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Authors: Sungyeop Jung, Chang-Hyun Kim, Yvan Bonnassieux, Gilles Horowitz

Journal title: Journal of Physics D: Applied Physics

Journal number: 48/3

Journal publisher: Institute of Physics Publishing

Published year: 2015

Published pages: 035106

DOI identifier: 10.1088/0022-3727/48/3/035106

ISSN: 0022-3727