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Authors: Jong W. Jin, Sungyeop Jung, Yvan Bonnassieux, Gilles Horowitz, Alexandra Stamateri, Christos Kapnopoulos, Argiris Laskarakis, Stergios Logothetidis
Journal title: IEEE Transactions on Electron Devices
Journal number: 63/10
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2016
Published pages: 4053-4059
DOI identifier: 10.1109/TED.2016.2598793
ISSN: 0018-9383