On the series resistance in staggered amorphous thin film transistors

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Authors: Antonio Cerdeira, Magali Estrada, Lluis F. Marsal, Josep Pallares, Benjamín Iñiguez

Journal title: Microelectronics Reliability

Journal number: 63

Journal publisher: Elsevier BV

Published year: 2016

Published pages: 325-335

DOI identifier: 10.1016/j.microrel.2016.05.005

ISSN: 0026-2714