Oxide thin film transistor technology: Capturing device-circuit interactions

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Authors: Arokia Nathan, Sungsik Lee, Sanghun Jeon, Reza Chaji

Journal title: 2015 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2015

Published pages: 6.7.1-6.7.4

DOI identifier: 10.1109/IEDM.2015.7409643

ISBN: 978-1-4673-9894-7