An approach to organic field-effect transistor above-threshold drains current compact modeling that provides monotonic decrease of the output conductance with drain bias increasing

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Authors: V O Turin, B A Rakhmatov, C H Kim, B Iñiguez

Journal title: IOP Conference Series: Materials Science and Engineering

Journal number: 151

Journal publisher: IOPScience

Published year: 2016

Published pages: 012044

DOI identifier: 10.1088/1757-899X/151/1/012044

ISSN: 1757-8981