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Authors: Jun Du, Erol Gelenbe, Chunxiao Jiang, Haijun Zhang, Yong Ren, H. Vincent Poor
Journal title: IEEE Transactions on Information Forensics and Security
Journal number: 14/6
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2019
Published pages: 1582-1594
DOI identifier: 10.1109/tifs.2018.2883000
ISSN: 1556-6013