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Authors: Schreiber, V., Ivanov, V., Augsburg, K., Noack, M., Shyrokau, B., Sandu, C., and Els, P.S.
Journal title: IEEE Access
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2017
DOI identifier: 10.1109/ACCESS.2017.2789020
ISSN: 2169-3536