Summary
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Authors: Naser Hakimi, Jörn M. Horschig, Thomas Alderliesten, Mathijs Bronkhorst, Marianne J. Floor-Westerdijk, Frank V.Bel, Willy N.J.M. Colier, Jeroen Dudink
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal number: Vol 72
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2023
DOI identifier: 10.1109/tim.2023.3295015
ISSN: 0018-9456