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Authors: M. Shahzeb Khan Gul, M. Umair Mukati, Michel Baetz, Soren Forchammer, Joachim Keinert
Journal title: IEEE Acess
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2022
DOI identifier: 10.1109/access.2022.3142949
ISSN: 2169-3536
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