Three-dimensional localization microscopy using deep learning

Summary

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Authors: P. Zelger, K. Kaser, B. Rossboth, L. Velas, G. J. Schütz, A. Jesacher

Journal title: Optics Express

Journal number: 26/25

Journal publisher: Optical Society of America

Published year: 2018

Published pages: 33166

DOI identifier: 10.1364/oe.26.033166

ISSN: 1094-4087