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Authors: Steven Derrien, Isabelle Puaut, Panayiotis Alefragis, Marcus Bednara, Harald Bucher, Clement David, Yann Debray, Umut Durak, Imen Fassi, Christian Ferdinand, Damien Hardy, Angeliki Kritikakou, Gerard Rauwerda, Simon Reder, Martin Sicks, Timo Stripf, Kim Sunesen, Timon ter Braak, Nikolaos Voros, Jurgen Becker
Journal title: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017
Journal publisher: IEEE
Published year: 2017
Published pages: 286-289
DOI identifier: 10.23919/DATE.2017.7927000
ISBN: 978-3-9815370-8-6
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