Electrical characterization of AMS aH18 HV-CMOS after neutrons and protons irradiation

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Authors: DMS Sultan, S. Gonzalez Sevilla, D. Ferrere, G. Iacobucci, E. Zaffaroni, W. Wong, M.V. Barrero Pinto, M. Kiehn, M. Prathapan, F. Ehrler, I. Peric, A. Miucci, J. Kenneth Anders, A. Fehr, M. Weber, A. Schoening, A. Herkert, H. Augustin, M. Benoit

Journal title: Journal of Instrumentation

Journal number: 14/05

Journal publisher: Institute of Physics

Published year: 2019

Published pages: C05003-C05003

DOI identifier: 10.1088/1748-0221/14/05/c05003

ISSN: 1748-0221