Impact of TCAD model parameters on optical and electrical characteristics of radiation-hard photodiode in 0.35bm CMOS technology

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Authors: Filip Segmanovic, Frederic Roger, Gerald Meinhardt, Ingrid Jonak-Auer, Tomislav Suligoj

Journal title: 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)

Journal publisher: IEEE

Published year: 2018

Published pages: 0018-0022

DOI identifier: 10.23919/mipro.2018.8400003

ISBN: 978-953-233-095-3