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Authors: Jing Zhang, Grigorij Muliuk, Jeroen Goyvaerts, Bahawal Haq, Sulakshna Kumari, Joan Juvert, Camiel Op de Beeck, Bart Kuyken, Joris Van Campenhout, Guy Lepage, Peter Verheyen, Agnieszka Gocalinska, Emanuele Pelucchi, Brian Corbett, Antonio Jose Trindade, Chris Bower, Gunther Roelkens
Journal title: 2019 24th Microoptics Conference (MOC)
Journal number: The 24th, 17 - 20 Nov 2019
Journal publisher: IEEE
Published year: 2019
Published pages: 64-65
DOI identifier: 10.23919/moc46630.2019.8982786
ISBN: 978-4-86348-712-3