3D Microstructure Characterization of a Silicon Based Anode Material on Different Length Scales suitable for Storage Applications

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Authors: T. Vorauer, P. Kumar, F. F. Chamasemani, J. Rosc, B. Fuchsbichler, S. Koller, L. Helfen, P.H. Jouneau, S. Lyonnard, R. Brunner

Journal title: Microscopy and Microanalysis

Journal number: 25/S2

Journal publisher: Cambridge University Press

Published year: 2019

Published pages: 356-357

DOI identifier: 10.1017/s1431927619002514

ISSN: 1431-9276