Summary
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Authors: Y Sun, P Parra-Rivas, C Milián, YV Kartashov, M Ferraro, F Mangini, M Zitelli, R Jauberteau, FR Talenti, S Wabnitz
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/cleo/europe-eqec57999.2023.10232033