Defect formation in InGaAs/AlSb/InAs memory devices

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: A. Trevisan, P. D. Hodgson, D. Lane, M. Hayne & P. Koenraad

Journal title: Journal of Vacuum Science and Technology B

Journal publisher: AVS

Published year: 2023

DOI identifier: 10.1116/6.0002677

ISSN: 2166-2746