Exploring the Environmental Benefits of In-Process Isolation for Software Resilience

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Authors: Gülmez, Merve; Nyman, Thomas; Baumann, Christoph; Mühlberg, Jan Tobias

Journal title: 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DNS-S)

Journal number: 9

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/dsn-s58398.2023.00056