Friend or Foe Inside? Exploring In-Process Isolation to Maintain Memory Safety for Unsafe Rust

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Authors: Gülmez, Merve; Nyman, Thomas; Baumann, Christoph; Mühlberg, Jan Tobias

Journal title: 2023 IEEE Secure Development Conference (SecDev)

Journal number: 8

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/secdev56634.2023.00020