Sub-Millisecond Transient Analysis with Multi-Point Measurement in Weak Grids

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Authors: A. Matthee, N. Moonen, F. Leferink

Journal title: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE

Journal number: 23-25 Sept. 2020

Journal publisher: IEEE

Published year: 2020

Published pages: 1-6

DOI identifier: 10.1109/emceurope48519.2020.9245718

ISBN: 978-1-7281-5579-1