Micro-Grid Inrush Current Stability Analysis

Summary

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Authors: Alexander Matthee, Niek Moonen, Frank Leferink

Journal title: 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium

Journal number: 26 July-13 Aug. 2021

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/emc/si/pi/emceurope52599.2021.9559165

ISBN: 978-1-6654-4888-8