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Authors: W. El Sayed, P. Crovetti, P. Lezynski, R. Smolenski, A. Madi and F. Grassi
Journal title: 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/emc/si/pi/emceurope52599.2021.9559175
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