An Open Source, FPGA-Based Bit Error Ratio Tester for Serial Communications

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Authors: M. J. Basford, A. E. Pena-Quintal, S. Greedy, M. Sumner, D. W. P. Thomas

Journal title: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE

Journal publisher: IEEE

Published year: 2020

Published pages: 1-6

DOI identifier: 10.1109/emceurope48519.2020.9245786

ISBN: 978-1-7281-5579-1