Standardized Impedance: Microgrid Perspective for Inrush Current Compliance

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Authors: Alexander Matthee,Niek Moonen,Frank Leferink

Journal title: 2022 International Symposium on Electromagnetic Compatibility – EMC Europe

Journal number: 05-08 September 2022

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/emceurope51680.2022.9900942

ISBN: 978-1-6654-0789-2