Versatile High-Sample Frequency Power Quality Measurement Device

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Authors: Alexander Matthee, Niek Moonen, Frank Leferink

Journal title: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

Journal number: 28 July-28 Aug. 2020

Journal publisher: IEEE

Published year: 2020

Published pages: 213-215

DOI identifier: 10.1109/emcsi38923.2020.9191575

ISBN: 978-1-7281-7430-3