Attosecond metrology in a continuous-beam transmission electron microscope.

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Authors: Andrey Ryabov; Andrey Ryabov; Johannes W. Thurner; David Nabben; M. V. Tsarev; Peter Baum; Peter Baum

Journal title: Science Advances

Journal number: 39

Journal publisher: American Association for the Advancement of Science

Published year: 2020

DOI identifier: 10.1126/sciadv.abb1393

ISSN: 2375-2548