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Authors: C. Dujardin, E. Auffray, E. Bourret-Courchesne, P. Dorenbos, P. Lecoq, M. Nikl, A. N. Vasil'ev, A. Yoshikawa, R.-Y. Zhu
Journal title: IEEE Transactions on Nuclear Science
Journal number: 65/8
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 1977-1997
DOI identifier: 10.1109/tns.2018.2840160
ISSN: 0018-9499