Summary
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Authors: O. Sakthong, W. R. Chewpraditkul, W. Chewpraditkul, T. Szczesniak, L. Swiderski, M. Moszynski, K. Kamada, A. Yoshikawa, M. Nikl
Journal title: IEEE Transactions on Nuclear Science
Journal number: 65/8
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 2081-2084
DOI identifier: 10.1109/TNS.2018.2809563
ISSN: 0018-9499