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Authors: E. Auffray, G.Dosovitskiy, A. Fedorov, S. Gundacker, I. Guz M. Korjik, D.Kozlov, M. Lucchini, V. Mechinsky,L. Martinazzoli, S. Nargelas, M. Pizzichemi, G. Tamulaitis, A. Vaitkevicius
Journal publisher: IEEE NSS/MIC 2018
Published year: 2018