LETS: A Label-Efficient Training Scheme for Aspect-Based Sentiment Analysis by Using a Pre-Trained Language Model

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Authors: Heereen Shim, Dietwig Lowet, Stijn Luca, Bart Vanrumste

Journal title: IEEE Access

Journal number: 9

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2021

Published pages: 115563-115578

DOI identifier: 10.1109/access.2021.3101867

ISSN: 2169-3536