On the reset threshold voltage of ReRAM devices and its impact on the implication logic operation

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Authors: G. C. Adam

Journal title: 2017 International Semiconductor Conference (CAS)

Journal publisher: IEEE

Published year: 2017

Published pages: 159-160

DOI identifier: 10.1109/SMICND.2017.8101186

ISBN: 978-1-5090-3985-2