Utilizing I-V non-linearity and analog state variations in ReRAM-based security primitives

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Authors: G. C. Adam, H. Nili, J. Kim, B. D. Hoskins, O. Kavehei, D. B. Strukov

Journal title: 2017 47th European Solid-State Device Research Conference (ESSDERC)

Journal publisher: IEEE

Published year: 2017

Published pages: 74-77

DOI identifier: 10.1109/ESSDERC.2017.8066595

ISBN: 978-1-5090-5978-2