A Back-End-Of-Line Compatible, Ferroelectric Analog Non-Volatile Memory

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Authors: L. Begon-Lours, M. Halter, D. Davila Pineda, V. Bragaglia, Y. Popoff, A. la Porta, D. Jubin, J. Fompeyrine, B. J. Offrein

Journal title: 2021 IEEE International Memory Workshop (IMW)

Journal publisher: IEEE

Published year: 2021

Published pages: 1-4

DOI identifier: 10.1109/imw51353.2021.9439611

ISBN: 978-1-7281-8517-0