Summary
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Authors: L. Begon-Lours, M. Halter, Y. Popoff, Z. Yu, D.F. Falcone, D. Davila, V. Bragaglia, A. La Porta, D. Jubin, J. Fompeyrine, B. J. Offrein
Journal title: IEEE Journal of the Electron Devices Society
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2021
Published pages: 1-1
DOI identifier: 10.1109/jeds.2021.3108523
ISSN: 2168-6734