A BEOL Compatible, 2-Terminals, Ferroelectric Analog Non-Volatile Memory

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Authors: Laura Begon-Lours, Mattia Halter, Diana Davila Pineda, Youri Popoff, Valeria Bragaglia, Antonio La Porta, Daniel Jubin, Jean Fompeyrine, Bert Jan Offrein

Journal title: 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

Journal publisher: IEEE

Published year: 2021

Published pages: 1-3

DOI identifier: 10.1109/edtm50988.2021.9420886

ISBN: 978-1-7281-8176-9