Sensitivity of CT dimensional measurements to rotation stage errors

Summary

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Authors: Massimiliano Ferrucci, Evelina Ametova, Gabriel Probst, Tom Craeghs, Wim Dewulf

Journal title: 8th Conference on Industrial Computed Tomography

Journal publisher: ndt.net

Published year: 2018

DOI identifier: 10.5281/zenodo.3352797

ISSN: 1435-4934