Impact of different types of planar defects on current transport in Indium Phosphide (InP)

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Authors: Christian Dam Vedel, Enrico Brugnolotto, Soren Smidstrup, Vihar P. Georgiev

Journal title: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)

Journal publisher: IEEE

Published year: 2021

Published pages: 1-5

DOI identifier: 10.1109/eurosoi-ulis53016.2021.9560698

ISBN: 978-1-6654-3745-5