Finite-Length Bounds on Hypothesis Testing Subject to Vanishing Type I Error Restrictions

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Authors: Sebastian Espinosa, Jorge F. Silva, Pablo Piantanida

Journal title: IEEE Signal Processing Letters

Journal number: 28

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 229-233

DOI identifier: 10.1109/lsp.2021.3050381

ISSN: 1070-9908