On the Exponential Approximation of Type II Error Probability of Distributed Test of Independence

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Authors: Espinosa, Sebastian; Silva, Jorge F.; Piantanida, Pablo

Journal title: IEEE Transactions on Signal and Information Processing over Networks

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 777 - 790

DOI identifier: 10.1109/tsipn.2021.3133192

ISSN: 2373-776X