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Authors: M. Tahoori, S. M. Nair, R. Bishnoi, S. Senni, J. Mohdad, F. Mailly, L. Torres, P. Benoit, A. Gamatie, P. Nouet, F. Ouattara, G. Sassatelli, K. Jabeur, P. Vanhauwaert, A. Atitoaie, I. Firastrau, G. Di Pendina, G. Prenat
Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2018
Published pages: 931-936
DOI identifier: 10.23919/date.2018.8342143
ISBN: 978-3-9819263-0-9
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