Temperature Limits of Single and Composite Storage Layer with Different Thicknesses and Capping Materials for p-STT-MRAM Applications

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Authors: Luc Tillie, Jyotirmoy Chatterjee, Ricardo Sousa, Stephane Auffret, Jude Guelfucci, Etienne Nowak, Bernard Dieny, Ioan-Lucian Prejbeanu, N. Lamard

Journal title: 2018 IEEE International Memory Workshop (IMW)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-4

DOI identifier: 10.1109/imw.2018.8388854

ISBN: 978-1-5386-5247-3