P-STT-MRAM thermal stability and modeling of its temperature dependence

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Authors: L. Tillie, B. Dieny, R. C. Sousa, J. Chatterjee, S. Auffret, N. Lamard, J. Guelffucci, E. Nowak, I.L. Prejbeanu

Journal title: 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-2

DOI identifier: 10.1109/vlsi-tsa.2018.8403857

ISBN: 978-1-5386-4825-4