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Authors: J. Evangelista, H. Loschi, E. T. Costa, R. Smolenski, N. Moonen and R. Vogt-Ardatjew
Journal title: 2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/apemc49932.2021.9597035
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