Impact of Pseudo-Random Modulation on Measured Conducted EMI

Summary

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Authors: Angel Pena-Quintal, Hermes Loschi, Robert Smolenski, Mark Sumner, Dave Thomas, Steve Green, Piotr Lezynski and Frank Leferink

Journal title: IEEE Electromagnetic Compatibility Magazine

Journal number: 21622272

Journal publisher: IEEE Electromagnetic Compatibility Society

Published year: 2022

DOI identifier: 10.1109/memc.2022.9873829

ISSN: 2162-2272