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Authors: D. Nascimento, R. Smolenski, H. Loschi, A. Madi, M. Alamsyah and F. Vieira
Journal title: 2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/apemc49932.2021.9596960