Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays

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Authors: Alessandro Grossi, Damian Walczyk, Cristian Zambelli, Enrique Miranda, Piero Olivo, Valeriy Stikanov, Alessandro Feriani, Jordi Sune, Gunter Schoof, Rolf Kraemer, Bernd Tillack, Alexander Fox, Thomas Schroeder, Christian Wenger, Christian Walczyk

Journal title: IEEE Transactions on Electron Devices

Journal number: 62/8

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2015

Published pages: 2502-2509

DOI identifier: 10.1109/TED.2015.2442412

ISSN: 0018-9383