Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2

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Authors: Alessandro Grossi, Eduardo Perez, Cristian Zambelli, Piero Olivo, Christian Wenger

Journal title: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Journal publisher: IEEE

Published year: 2016

Published pages: 80-83

DOI identifier: 10.1109/ULIS.2016.7440057

ISBN: 978-1-4673-8609-8