RRAM Reliability/Performance Characterization through Array Architectures Investigations

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Cristian Zambelli, Alessandro Grossi, Piero Olivo, Christian Walczyk, Christian Wenger

Journal title: 2015 IEEE Computer Society Annual Symposium on VLSI

Journal publisher: IEEE

Published year: 2015

Published pages: 327-332

DOI identifier: 10.1109/ISVLSI.2015.17

ISBN: 978-1-4799-8719-1